I'm not a probe guy. i spent about 30 years making both ICs and discrete.
I am most familiar with probe parametrics as they apply to my area of specialty.
As for probers, I know they weren't HP. The last ones I remember were some kind of european 4 station from one central computer/data gatherer. Individual histograms of each wafer were stored for later analysis...patterns of failure and such. I avoided probe....looked too much like work.
I am much more comfortable with diffusion / implant / metalization and was very good at metrology. Nanometrics equipement, surface profile stuff and elipsometer along with various 4pt probe and specialty tools.
I am most familiar with probe parametrics as they apply to my area of specialty.
As for probers, I know they weren't HP. The last ones I remember were some kind of european 4 station from one central computer/data gatherer. Individual histograms of each wafer were stored for later analysis...patterns of failure and such. I avoided probe....looked too much like work.
I am much more comfortable with diffusion / implant / metalization and was very good at metrology. Nanometrics equipement, surface profile stuff and elipsometer along with various 4pt probe and specialty tools.