This post was interesting, until I reached the part where you FINALLY mentioned the off-centre cantilever.
If the cantilever is visibly off-centre, why waste time on performance measurements? The manufacturer did not quote specs from, nor would any reasonable person expect on-spec performance from, a visibly flawed sample. Measuring junk is silly - discussing those measurements is inane. ;-)
For azimuth and VTA (SRA), MAJOR changes always have MINOR effects. These two adjustments have VERY TINY target zones. Once you're outside those zones, further changes have little effect or, in the case of azimuth, even contradictory or unpredictable effects.
Changes to these parameters must be made in TINY increments, lest you swing back and forth past the target zone without ever hitting it. A 2 degree azimuth change is at least 10 times larger than the target zone, so the probability of hitting it with such changes is quite low.
Better sample + smaller adjustments = better results with fewer measurements.
If the cantilever is visibly off-centre, why waste time on performance measurements? The manufacturer did not quote specs from, nor would any reasonable person expect on-spec performance from, a visibly flawed sample. Measuring junk is silly - discussing those measurements is inane. ;-)
I have also noted that in this instance, MAJOR Azimuth (+/- 2 deg), VTA, VTF, changes had absolutely MINOR measured effectThis is true for all cartridges.
For azimuth and VTA (SRA), MAJOR changes always have MINOR effects. These two adjustments have VERY TINY target zones. Once you're outside those zones, further changes have little effect or, in the case of azimuth, even contradictory or unpredictable effects.
Changes to these parameters must be made in TINY increments, lest you swing back and forth past the target zone without ever hitting it. A 2 degree azimuth change is at least 10 times larger than the target zone, so the probability of hitting it with such changes is quite low.
Better sample + smaller adjustments = better results with fewer measurements.