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Ralph,
Again, I'm dumbfounded you continue to defend what is clearly wrong.
I've been dealing with electronics for over 30 years, taught it for 10, and have looked at this topic quite a bit since it often comes up on this and other forums. I've never seen it mentioned that 1/2 fail in 20 years or any other statistic that puts a lifetime like that on them. Any data always factors in temperature and voltage. I really respect most of what you say here but you clearly have no real data to back up any of these 20 year claims.
Yes, English evolves but that doesn't mean it is acceptable to use it in any way you wish. Half life has a very clear, concise, scientific definition and your use of it is well outside that definition. Ir would be nice if someone on these forums would just once admit they are wrong.
MTBF to describe cap failure is also incorrect as stated above. It refers to complex, repairable devices, not components. How can you possibly have a "mean time BETWEEN failures" for a device that is thrown away when it fails? There is never a second failure so there can never be a between. From this article
MTBF is properly used only for components that can be repaired and returned to service.
Yes, I suspect the caps we are seeing fail are part of what you talked about. I posted a link to it in my response above.
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