@lewm - Sorry I wasn't more clear. Yes, I meant thermal noise from input resistance.
The SUT in question had 3900 ohms on the secondary (thin wire), which generated quite a bit of noise, much more than I get from my JFET-based headamp.
And yes, you can use the ESR of a cartridge to perform a baseline minimum noise floor calculation. You then have added noise (aka noise factor in the RF world) from the amplification (which you can break down by stage). The first stage is by far the most important. That's why I use special low noise matched JFETs for MC front-end.
Another good test for "tube rush" is to compare noise level between open and shorted inputs. Most of the noise you hear open is from the 47k loading resistor. Shorted, you hear the amplifier and tube rush.
The SUT in question had 3900 ohms on the secondary (thin wire), which generated quite a bit of noise, much more than I get from my JFET-based headamp.
And yes, you can use the ESR of a cartridge to perform a baseline minimum noise floor calculation. You then have added noise (aka noise factor in the RF world) from the amplification (which you can break down by stage). The first stage is by far the most important. That's why I use special low noise matched JFETs for MC front-end.
Another good test for "tube rush" is to compare noise level between open and shorted inputs. Most of the noise you hear open is from the 47k loading resistor. Shorted, you hear the amplifier and tube rush.